February 2, 2011 – 1:00 pm
Knowledge Management in Electronic Government: 5th IFIP International Working Conference, KMGov 2004, Krems, Austria, May 17-19, 2004, Proceedings … / Lecture Notes in Artificial Intelligence) Review

Knowledge Management in Electronic Government: 5th IFIP International Working Conference, KMGov 2004, Krems, Austria, May 17-19, 2004, Proceedings … / Lecture Notes in Artificial Intelligence) Overview
This book constitutes the refereed proceedings of the 5th IFIP International Working Conference on Knowledge Management in Electronic Government, KMGov 2004, held in Krems, Austria in May 2004.
The 34 revised full papers presented were carefully reviewed and selected for publication. The papers are organized in topical sections on KM concepts and methodologies, strategies to implement KM in the public sector, knowledge ontologies and structuring concepts for public administration, technologies for KM support in public administrations, requirements engineering for KM, representing legal and procedural knowledge, KM support for democratic processes and citizen participation, and examples of KM in public administrations and case studies.
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February 1, 2011 – 12:24 pm
Tolerance Analysis of Electronic Circuits Using MATLAB Review

Tolerance Analysis of Electronic Circuits Using MATLAB Overview
Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATLAB offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including:·worst-case analysis,·limits for production testing,·component stress analysis,·determining if a design meets specification limits, and·manufacturing yield analysisUsing a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.
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